Metrological Tools are very important in order to characterize your materials and devices. SIMCO offers the following instruments and equipment,

  • Solar PV wafers metrology,
  • Carrier Lifetime, micro-PCD, Sheet Resistance
  • LBIC Measurement
  • IQE and EQE Measurement
  • Resistivity & Thickness Measurement
  • Laser & Spectroscopic Ellipsometer in UV-VIS-IR range
  • Nano-Hardness tester
  • Thin Film thickness measurement using reflectometry
  • Lock-in Amplifiers and Boxcar averager, RGA, Vacuum gauge
  • X-ray Photoelectron Spectroscopy for ESCA, XPS, ARPES, SEM
  • Solar Simulators for Solar PV
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